Let's say if I have two partition with two programs,

I want to choose which partition to boot based on a GPIO status during power up, can I do that?

When I run WIFI+BLE simultaneously, I touch the metal shield surface, I think it's around 40-50 DegC, is it normal?

OK. It looks like there are some hardware differences, for example one module has revision 0 silicon and the other has revision 1. This is almost certainly not the cause of the bug, but it may change timing around a tiny bit - making it enough to trigger on one module. Suggest following the steps a...

Actually, from my observation, I found that brand B will also restart occasionally, but the chance is small. I just do little modification in the gattc example code from the latest idf, I added 5 char and just replace the find char by uuid function to this one......... If I run find char by uuid fun...

Brand B: ets Jun 8 2016 00:22:57 rst:0x1 (POWERON_RESET),boot:0x13 (SPI_FAST_FLASH_BOOT) ets Jun 8 2016 00:22:57 rst:0x10 (RTCWDT_RTC_RESET),boot:0x13 (SPI_FAST_FLASH_BOOT) configsip: 0, SPIWP:0xee clk_drv:0x00,q_drv:0x00,d_drv:0x00,cs0_drv:0x00,hd_drv:0x00,wp_drv:0x00 mode:DIO, clock div:2 load:0x3...

Brand A: ets Jun 8 2016 00:22:57 rst:0x1 (POWERON_RESET),boot:0x13 (SPI_FAST_FLASH_BOOT) configsip: 0, SPIWP:0xee clk_drv:0x00,q_drv:0x00,d_drv:0x00,cs0_drv:0x00,hd_drv:0x00,wp_drv:0x00 mode:DIO, clock div:2 load:0x3fff0010,len:4 load:0x3fff0014,len:5544 load:0x40078000,len:0 ho 12 tail 0 room 4 loa...

I use the latest version IDF, with the module from brand A, when I use the function esp_ble_gattc_get_all char, it will trigger the heap corruption. However, when I use the module from another brand B, this problem doesn't appear, anyone can help? CORRUPT HEAP: multi_heap.c:173 detected at 0x3ffcf03...

vishnu, just refer to the wifi and ble example code and then use the related function.

No, I give up, i turn out used another gatt server example and completed my task.

either disable the brownout detection or connect with a external 5V supply.